Effect of a large hole reservoir on the charge transport in TiO2/organic hybrid devices.
Identifieur interne : 000E77 ( Main/Exploration ); précédent : 000E76; suivant : 000E78Effect of a large hole reservoir on the charge transport in TiO2/organic hybrid devices.
Auteurs : RBID : pubmed:22796904Abstract
We have fabricated hybrid devices in the form of indium tin oxide/titanium dioxide/poly(3-hexylthiophene):[6,6]-phenyl C61 butyric acid methyl ester/copper (ITO/TiO(2)/P3HT:PCBM/Cu) to clarify the impact of the TiO(2)/P3HT:PCBM interface on the charge transport using the charge extraction by linearly increasing voltage (CELIV) technique. We found that a large equilibrium charge reservoir is accumulated at negative offsets at the TiO(2)/P3HT:PCBM interface leading to space charge limited extraction current (SCLC) transients. We show analytically the SCLC transient response and compare the experimental data to calculated SCLC at a linearly increasing voltage. The theoretical calculations indicate that the large charge reservoir at negative offset voltages is due to thermally generated charges combined with poor hole extraction at the ITO/TiO(2) contact, due to the hole blocking character of TiO(2).
DOI: 10.1039/c2cp41543g
PubMed: 22796904
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<author><name sortKey="Sanden, Simon" uniqKey="Sanden S">Simon Sandén</name>
<affiliation wicri:level="1"><nlm:affiliation>Department of Natural Sciences, Åbo Akademi University, Finland. simon.sanden@abo.fi</nlm:affiliation>
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<wicri:regionArea>Department of Natural Sciences, Åbo Akademi University</wicri:regionArea>
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<author><name sortKey="Sandberg, Oskar" uniqKey="Sandberg O">Oskar Sandberg</name>
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<author><name sortKey="Xu, Qian" uniqKey="Xu Q">Qian Xu</name>
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<author><name sortKey="Sm Tt, Jan Henrik" uniqKey="Sm Tt J">Jan-Henrik Smått</name>
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<author><name sortKey="Ju Ka, Gytis" uniqKey="Ju Ka G">Gytis Juška</name>
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<author><name sortKey="Linden, Mika" uniqKey="Linden M">Mika Lindén</name>
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<author><name sortKey="Osterbacka, Ronald" uniqKey="Osterbacka R">Ronald Osterbacka</name>
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<front><div type="abstract" xml:lang="en">We have fabricated hybrid devices in the form of indium tin oxide/titanium dioxide/poly(3-hexylthiophene):[6,6]-phenyl C61 butyric acid methyl ester/copper (ITO/TiO(2)/P3HT:PCBM/Cu) to clarify the impact of the TiO(2)/P3HT:PCBM interface on the charge transport using the charge extraction by linearly increasing voltage (CELIV) technique. We found that a large equilibrium charge reservoir is accumulated at negative offsets at the TiO(2)/P3HT:PCBM interface leading to space charge limited extraction current (SCLC) transients. We show analytically the SCLC transient response and compare the experimental data to calculated SCLC at a linearly increasing voltage. The theoretical calculations indicate that the large charge reservoir at negative offset voltages is due to thermally generated charges combined with poor hole extraction at the ITO/TiO(2) contact, due to the hole blocking character of TiO(2).</div>
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<Abstract><AbstractText>We have fabricated hybrid devices in the form of indium tin oxide/titanium dioxide/poly(3-hexylthiophene):[6,6]-phenyl C61 butyric acid methyl ester/copper (ITO/TiO(2)/P3HT:PCBM/Cu) to clarify the impact of the TiO(2)/P3HT:PCBM interface on the charge transport using the charge extraction by linearly increasing voltage (CELIV) technique. We found that a large equilibrium charge reservoir is accumulated at negative offsets at the TiO(2)/P3HT:PCBM interface leading to space charge limited extraction current (SCLC) transients. We show analytically the SCLC transient response and compare the experimental data to calculated SCLC at a linearly increasing voltage. The theoretical calculations indicate that the large charge reservoir at negative offset voltages is due to thermally generated charges combined with poor hole extraction at the ITO/TiO(2) contact, due to the hole blocking character of TiO(2).</AbstractText>
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